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An Introduction to Space Radiation Effects on Microelectronics

I. INTRODUCTION
The use of microelectronic devices in spacecraft requires that these devices preserve
their functionality in the radiation environment found in space. This introductory course
presents a summary of the current understanding of the effects of radiation on
microelectronic devices. Topics include an overview of the radiation environment and
various types of effects (cumulative ionization, displacement damage, and single event
effects) that the environment may have on each of the common device technologies. The
interpretations and limitations of data obtained from standard test methods are also
discussed. This course is intended for non-experts who are seeking explanations of
terminology and fundamental concepts. The reader is expected to be acquainted with
semiconductor devices on a level treated by introductory textbooks, such as the book by
Streetman [1.1], but is not required to have any prior knowledge of radiation effects.
The objective of this course is to provide the reader with an awareness and general
knowledge of the degradation or loss of functionality that can occur in microelectronic
devices exposed to the space radiation environment. Upon completion of this course, the
reader should have an introductory—level understanding of the following:
The radiation environments and basic effects (cumulative ionization, etc.)
The meanings and effects of oxide trapped charge and interface states
Enhanced low dose rate effects in bipolar linear circuits
Multiple total dose failure modes in mixed signal devices
Displacement damage effects
Single event upsets in digital circuits
Single event transients in analog circuits
Single event latchups in various circuits
Single event gate rupture in power MOSFETs and other devices
Single event burnout in power MOSFETs and power bipolar devices
Single event functionality interrupt in DRAMs and other devices
Stuck bits in DRAMs
Single event dielectric rupture in FPGAs
Test methods (and limitations) for determining device radiation responses